Low Dielectric Loss High Frequency (RF) Ceramics

Features:

Insulating ceramics with low dielectric loss in the GHz and MHz bands.
Various materials are available, including low dielectric constant (ε), low dielectric loss tangent (tanδ) and high-strength types.
The Nishimura manufacturing process enables the production of small and complex shaped products as well as simple shapes such as plates. It can also be supplied as filler.

Usage:

5G mobile communications.
Aerospace, radar, microwave.
Next-generation communications field, medical field.
High-frequency substrate materials with heat resistance and durability, antenna materials, RF windows, materials for semiconductor manufacturing equipment.

Characteristics:

The characteristics of the main low-k dielectric loss ceramics for high frequency (RF) applications are shown in the following characteristics table and Figure 1: The relative permittivity (ε) and dielectric loss tangent (tanδ) at 1-10 GHz were measured at the Izumi Centre of the Osaka Industrial Technology Research Institute using the spatial resonator perturbation method.

Low dielectric loss 10 GHz（10^-5 Characteristics table

Nishimura No.	N-99DLT	N-999DLT	N-99
Dielectric Constant ε	9.85	9.82	9.668
Dielectric Losses tanδ (×10^-5)	2.7	1.0	23

Measured by the split cylinder method.

Property Table:

Nishimura No.		N-99DLT	N-999DLT	N-75	N-600
Materials		Alumina(Aℓ₂O₃99.7%)	Alumina(Aℓ₂O₃99.9%)	Forsterite	Cordierite
Bulk Specific Gravity	g/cm³	3.93	3.95	3.0	2.5
Water Absorption Ratio	％	0	0	0	0
Bending Strength	MPa	289	348	150	150
Young’s Modulus	GPa	388	392	━	━
Coefficient of Linear Thermal Expansion (30-300°C)	×10^-6/℃			8.97	0.98
Volume Resistivity	Ω・cm	> 10¹⁶	> 10¹⁶	> 10¹³	> 10¹⁴
Dielectric Constant ε	1MHz	━	━	6.5	4.9
	1GHz	9.5	9.6	6.6	4.8
	5GHz	9.5	9.6	6.7	4.8
Dielectric Losses tanδ (×10^-5)	1MHz	━	━	3.0	9.0
	1GHz	0.7	0.7	2.3	28
	5GHz	1.1	1.0	4.7	24

*The values given are representative and not guaranteed.